A study of a low copper dental amalgam by analytical transmission electron microscopy

被引：4
|
作者：
Hooghan, TK [1 ]
Pinizzotto, RF [1 ]
Watkins, JH [1 ]
Okabe, T [1 ]
机构：
[1] BAYLOR COLL DENT,DEPT BIOMAT SCI,DALLAS,TX 75246
来源：
JOURNAL OF MATERIALS RESEARCH | 1996年 / 11卷 / 10期
关键词：
D O I：
10.1557/JMR.1996.0312
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Analytical transmission electron microscopy was used to study specimens of a low-Cu dental amalgam (Velvalloy), prepared using the ''wedge technique.'' Analysis confirmed that the microstructure consists of a Ag2Hg3(gamma(1))/HgSn7-9(gamma(2)) matrix surrounding unreacted Ag3Sn(gamma) particles. In addition a hitherto uncharacterized reaction layer of fine grains between Ag3Sn(gamma) and Ag2Hg3(gamma(1)) is a mixture of Ag3Sn(gamma), Ag-Hg-Sn(beta(1)), Ag2Hg3(gamma(1)), and occasionally Cu6Sn5 (eta') An Ag-Hg-Sn(beta(1)) phase was clearly identified for the first time. Since Velvalloy is a simple commercial dental amalgam, it is a reasonable starting point for characterizing more complex dental amalgam microstructures.
引用
收藏
页码：2474 / 2485
页数：12
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