A study of a low copper dental amalgam by analytical transmission electron microscopy

被引：4

作者：

Hooghan, TK ^{[1
]}

Pinizzotto, RF ^{[1
]}

Watkins, JH ^{[1
]}

Okabe, T ^{[1
]}

机构：

[1] BAYLOR COLL DENT,DEPT BIOMAT SCI,DALLAS,TX 75246

来源：

JOURNAL OF MATERIALS RESEARCH | 1996年 / 11卷 / 10期

关键词：

D O I：

10.1557/JMR.1996.0312

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Analytical transmission electron microscopy was used to study specimens of a low-Cu dental amalgam (Velvalloy), prepared using the ''wedge technique.'' Analysis confirmed that the microstructure consists of a Ag2Hg3(gamma(1))/HgSn7-9(gamma(2)) matrix surrounding unreacted Ag3Sn(gamma) particles. In addition a hitherto uncharacterized reaction layer of fine grains between Ag3Sn(gamma) and Ag2Hg3(gamma(1)) is a mixture of Ag3Sn(gamma), Ag-Hg-Sn(beta(1)), Ag2Hg3(gamma(1)), and occasionally Cu6Sn5 (eta') An Ag-Hg-Sn(beta(1)) phase was clearly identified for the first time. Since Velvalloy is a simple commercial dental amalgam, it is a reasonable starting point for characterizing more complex dental amalgam microstructures.

引用

页码：2474 / 2485

页数：12

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