Sidewall oxide effects on spin-torque- and magnetic-field-induced reversal characteristics of thin-film nanomagnets

被引:54
作者
Ozatay, O. [1 ,2 ]
Gowtham, P. G. [1 ]
Tan, K. W. [1 ]
Read, J. C. [1 ]
Mkhoyan, K. A. [1 ]
Thomas, M. G. [1 ]
Fuchs, G. D. [1 ]
Braganca, P. M. [1 ]
Ryan, E. M. [1 ]
Thadani, K. V. [1 ]
Silcox, J. [1 ]
Ralph, D. C. [1 ]
Buhrman, R. A. [1 ]
机构
[1] Cornell Univ, Ithaca, NY 14853 USA
[2] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95136 USA
基金
美国国家科学基金会;
关键词
D O I
10.1038/nmat2204
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The successful operation of spin-based data storage devices depends on thermally stable magnetic bits. At the same time, the data-processing speeds required by today's technology necessitate ultrafast switching in storage devices. Achieving both thermal stability and fast switching requires controlling the effective damping in magnetic nanoparticles. By carrying out a surface chemical analysis, we show that through exposure to ambient oxygen during processing, a nanomagnet can develop an antiferromagnetic sidewall oxide layer that has detrimental effects, which include a reduction in the thermal stability at room temperature and anomalously high magnetic damping at low temperatures. The in situ deposition of a thin Al metal layer, oxidized to completion in air, greatly reduces or eliminates these problems. This implies that the effective damping and the thermal stability of a nanomagnet can be tuned, leading to a variety of potential applications in spintronic devices such as spin-torque oscillators and patterned media.
引用
收藏
页码:567 / 573
页数:7
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