Time-resolved fluorescence studies of degradation in tris(8-hydroxyquinoline) aluminum (AlQ3)-based organic light emitting devices (OLEDs)

被引：63

作者：

Popovic, ZD

Aziz, H

Ioannidis, A

Hu, NX

dos Anjos, PNM

机构：

[1] Xerox Res Ctr Canada Ltd, Mississauga, ON L5K 2LI, Canada

[2] Xerox Corp, Webster, NY USA

来源：

SYNTHETIC METALS | 2001年 / 123卷 / 01期

关键词：

organic electroluminescence; electroluminescence degradation; time-resolved fluorescence; OLED degradation;

D O I：

10.1016/S0379-6779(01)00472-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Device stability has been a major concern for organic light emitting devices (OLEDs). Recently, we found that the injection of holes in tris(8-hydroxyquinoline) aluminum (AlQ(3)), a widely used organic electroluminescent material, is the main factor responsible for degradation in OLEDs based on this material. The photoluminescence (PL) quantum efficiency of AlQ(3) has been found to decrease as a result of predominantly hole current flow. Studies using time-resolved fluorescence measurements show that the decrease in the PL quantum efficiency is associated with a decrease in the lifetime of the AlQ(3) excited states, thus revealing the nature of the degradation products as luminescence quenchers. (C) 2001 Elsevier Science B.V. All rights reserved.

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页码：179 / 181

页数：3

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