Arc root commutation from moving contacts in low voltage devices

被引:38
作者
McBride, JW [1 ]
Pechrach, K
Weaver, PM
机构
[1] Univ Southampton, Sch Engn Sci, Electromech Res Grp, Southampton SO17 1BJ, Hants, England
[2] PBT Ltd, Harlow CM20 2BN, Essex, England
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2001年 / 24卷 / 03期
基金
英国工程与自然科学研究理事会;
关键词
arc chamber; circuit breakers; contact velocity; high current arc;
D O I
10.1109/6144.946475
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper focus on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode are root motion is affected by are chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of are chamber venting, current level, current polarity and contact velocity on are motion. Particular emphasis is made to the anode motion. The physical process occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the are chamber.
引用
收藏
页码:331 / 336
页数:6
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