A compact μ-XRF spectrometer for (in situ) analyses of cultural heritage and forensic materials

A compact, light weight and relatively inexpensive mu-XRF instrument that allows for non-destructive and local analysis of sub-mm samples with minor/trace level sensitivity was developed. Two versions of this prototype instrument exist: a table-top version that can be used in a laboratory environment while for in situ measurements a readily transportable version was constructed. Polycapillary lenses are used to focus the primary X-ray beam down to the level of 70-100 mum in diameter. Relative detection limits of transition elements in biological and glass matrices are situated at the 10-100 ppm level. These instruments are useful for characterization of various materials from the cultural heritage and forensic sector. (C) 2003 Elsevier B.V. All rights reserved.