Characterization of grain microstructure development in the aluminum alloy EN AW-6060 during extrusion

被引:32
作者
Kayser, T. [1 ]
Klusemann, B. [1 ]
Lambers, H. -G. [2 ]
Maier, H. J. [2 ]
Svendsen, B. [1 ]
机构
[1] Dortmund Univ Technol, Inst Mech, D-44221 Dortmund, Germany
[2] Univ Gesamthsch Paderborn, Lehrstuhl Werkstoffkunde, D-33098 Paderborn, Germany
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2010年 / 527卷 / 24-25期
关键词
Aluminum alloys; EBSD; Grain microstructure; Recrystallization; Extrusion; RECRYSTALLIZATION;
D O I
10.1016/j.msea.2010.06.050
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The purpose of this work is the experimental investigation and statistical characterization of the grain microstructure and its development in aluminum alloys during hot extrusion. To this end, electron backscatter diffraction (EBSD) data are utilized. Based on this data, properties like the grain morphology, mean grain size, or mean grain misorientation, can be derived with the help of data analysis and processing methods. In the current work, these are applied to the investigation and quantitative determination of the microstructural development in the aluminum alloy EN AW-6060 along a path in the center of a partly extruded billet. With increasing deformation, it is observed that the mean grain size continually decreases due to dynamic recrystallization (CRX). As expected, grain alignment along the extrusion direction tends toward (1 1 1) with increasing deformation, and misorientation tends to decrease. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:6568 / 6573
页数:6
相关论文
共 28 条
[1]  
[Anonymous], 2013, Physical Foundations of Materials Science, DOI DOI 10.1007/978-3-662-09291-0
[2]  
[Anonymous], 1993, ASM INT
[3]  
ASTM, 2004, E112-96
[4]  
BAUSER M, 2006, EXTRUSION SECOND, P141
[5]   Detectors for X-ray diffraction and scattering:: a user's overview [J].
Brügemann, L ;
Gerndt, EKE .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2004, 531 (1-2) :292-301
[6]  
BRUNGER E, 2006, MICROSTRUCTURE PROPE, P51
[7]   Positive effect of natural pre-ageing on precipitation hardening in Al-0.44 at% Mg-0.38 at% Si alloy [J].
Chang, C. S. T. ;
Wieler, I. ;
Wanderka, N. ;
Banhart, J. .
ULTRAMICROSCOPY, 2009, 109 (05) :585-592
[8]   MICROTEXTURE DETERMINATION BY ELECTRON BACK-SCATTER DIFFRACTION [J].
DINGLEY, DJ ;
RANDLE, V .
JOURNAL OF MATERIALS SCIENCE, 1992, 27 (17) :4545-4566
[9]   Current issues in recrystallization: a review [J].
Doherty, RD ;
Hughes, DA ;
Humphreys, FJ ;
Jonas, JJ ;
Jensen, DJ ;
Kassner, ME ;
King, WE ;
McNelley, TR ;
McQueen, HJ ;
Rollett, AD .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1997, 238 (02) :219-274
[10]   A novel pole figure inversion method: specification of the MTEX algorithm [J].
Hielscher, R. ;
Schaeben, H. .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2008, 41 :1024-1037