Standardless Atom Counting in Scanning Transmission Electron Microscopy

被引：193

作者：

LeBeau, James M. ^{[1
]}

Findlay, Scott D. ^{[2
]}

Allen, Leslie J. ^{[3
]}

Stemmer, Susanne ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

[2] Univ Tokyo, Sch Engn, Inst Engn Innovat, Tokyo 1138656, Japan

[3] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

来源：

NANO LETTERS | 2010年 / 10卷 / 11期

基金：

美国国家科学基金会; 澳大利亚研究理事会;

关键词：

Scanning transmission electron microscopy (STEM); gold; nanoscale characterization; SURFACE ATOMS; STEM;

D O I：

10.1021/nl102025s

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need For a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.

引用

页码：4405 / 4408

页数：4

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