EBSD-based continuum dislocation microscopy

被引：48

作者：

Gardner, Calvin J. ^{[1
]}

Adams, Brent L. ^{[1
]}

Basinger, John ^{[1
]}

Fullwood, David T. ^{[1
]}

机构：

[1] Brigham Young Univ, Dept Mech Engn, Provo, UT 84602 USA

来源：

INTERNATIONAL JOURNAL OF PLASTICITY | 2010年 / 26卷 / 08期

基金：

美国国家科学基金会;

关键词：

Dislocations; Grain boundaries; Polycrystalline material; Electron microscopy; Boundary integral equations; ELASTIC STRAIN-MEASUREMENT; DIFFRACTION; DEFORMATION; SIMULATIONS; PATTERNS;

D O I：

10.1016/j.ijplas.2010.05.008

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of elastic fields and incompatibility structures near the grain boundaries (GBS) in polycrystals. Two main recoveries are reported here: surface geometrically necessary dislocation (density) tensors, as described by Kroner, and the elastic fields near cracks (unconsolidated portions of interface) in loaded samples. Context for the application of these recoveries is described, using Green's function solutions for combined heterogeneity and dislocation. Featured recoveries required the cross-correlation based determination of the elastic distortion tensor, aided by application of the simulated pattern method, and determination of the absolute pattern center utilizing the expected pattern properties in a spherical Kikuchi reference frame. High-resolution data obtained along an ultrasonically consolidated nickel boundary of varying amalgamation indicates that the imposed traction free boundary condition at free surfaces is well observed in the data structure. Further, high-resolution data acquired near a single grain boundary in well-annealed, low content steel suggests that it may be possible to measure the intrinsic elastic properties of GBs. (C) 2010 Elsevier Ltd. All rights reserved.

引用

页码：1234 / 1247

页数：14

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