Test of ATLAS SCT barrel modules with Nd:YAG laser

被引：7

作者：

Hara, K

Minagawa, M

Kuwano, T

Nakamura, K

Nakamura, Y

Sengoku, H

Ikegami, Y

Kohriki, T

Kondo, T

Terada, S

Unno, Y

Takashima, R

Nakano, I

Tanaka, R

Iwata, Y

Ohsugi, T

机构：

[1] Univ Tsukuba, Grad Sch Pure & App Sci, Tsukuba, Ibaraki 3058571, Japan

[2] KEK, High Energy Accelerator Res Org, Tsukuba, Ibaraki 3050801, Japan

[3] Kyoto Univ, Kyoto 6128522, Japan

[4] Okayama Univ, Dept Phys Sci, Okayama 7008530, Japan

[5] Hiroshima Univ, Dept Phys Sci, Higashihiroshima 7398526, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 541卷 / 1-2期

关键词：

silicon microstrip detector; ATLAS SCT; laser test;

D O I：

10.1016/j.nima.2005.01.048

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

As a part of the quality assurance procedure of the ATLAS SCT (Semiconductor Tracker) barrel modules, the response of the microstrip detector is measured by injecting focused Nd:YAG laser at each strip. The test is sensitive to sensor originated problems and a cross check to the results obtained from the electrical tests performed with the test pulse system implemented in the readout ASICs. Combining these results with the probing results obtained by the silicon sensor manufacturer, we verified the reliabilities of these tests and classified the type of defects for overall performance evaluation of the modules. (c) 2005 Published by Elsevier B.V.

引用

页码：122 / 129

页数：8

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