X-ray peak profile analysis of solid-state sintered alumina doped zinc oxide ceramics by Williamson-Hall and size-strain plot methods

被引:137
作者
Kumar, B. Rajesh [1 ]
Hymavathi, B. [2 ]
机构
[1] GITAM Univ, GITAM Inst Technol, Dept Phys, Visakhapatnam 530045, AP, India
[2] Anil Neerukonda Inst Technol & Sci Autonomous, Dept Phys, Visakhapatnam 531162, AP, India
来源
JOURNAL OF ASIAN CERAMIC SOCIETIES | 2017年 / 5卷 / 02期
关键词
Solid-state reaction; XRD; Scanning electron microscopy; DIFFRACTION PEAKS; ZNO NANOPARTICLES; FILMS;
D O I
10.1016/j.jascer.2017.02.001
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
ZnO doped with different concentrations of Al2O3 (2, 4, 6, 8 and 10 wt%) is prepared by conventional solid-state reaction method. X-ray diffraction results revealed that the samples were crystalline with a hexagonal wurtzite phase. As the concentration of alumina (Al2O3) increases in ZnO, the X-ray diffraction peaks shifts towards higher angle. This shifting in peak position and decrease in intensity reflect that Al is successfully replaced Zn in ZnO matrix. X-ray peak broadening analysis was used to evaluate the crystallite size and lattice strain by the Williamson-Hall (W-H) method and size-strain plot (SSP) method. The physical parameters such as strain, stress, and energy density values were also calculated using W-H method with different models namely uniform deformation model, uniform stress deformation model and uniform deformation energy density model. The surface morphology and elemental analysis of the prepared samples were characterized by field emission scanning electron microscopy and energy dispersive spectra. (C) 2017 The Ceramic Society of Japan and the Korean Ceramic Society. Production and hosting by Elsevier B.V. This is an open access article under the CC BY-NC-ND license
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页码:94 / 103
页数:10
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