Giant Piezoresistance Effects in Silicon Nanowires and Microwires

被引:115
作者
Milne, J. S. [1 ]
Rowe, A. C. H. [1 ]
Arscott, S. [2 ]
Renner, Ch. [3 ]
机构
[1] Ecole Polytech, CNRS, F-91128 Palaiseau, France
[2] CNRS, IEMN, UMR8520, F-59652 Villeneuve Dascq, France
[3] Univ Geneva, Dept Condensed Matter Phys, NCCR Mat Novel Elect Properties, CH-1211 Geneva 4, Switzerland
关键词
SYSTEMS; CHARGE;
D O I
10.1103/PhysRevLett.105.226802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The giant piezoresistance (PZR) previously reported in silicon nanowires is experimentally investigated in a large number of depleted silicon nano-and microstructures. The resistance is shown to vary strongly with time due to electron and hole trapping at the sample surfaces independent of the applied stress. Importantly, this time-varying resistance manifests itself as an apparent giant PZR identical to that reported elsewhere. By modulating the applied stress in time, the true PZR of the structures is found to be comparable with that of bulk silicon.
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页数:4
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