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Nucleation and growth of ultrathin BaTiO3 films on single terminated Nb:SrTiO3 (100) substrates for ferroelectric tunnel junctions
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Ambriz-Vargas, Fabian
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INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada

Velasco-Davalos, Ivan
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INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada

Thomas, Reji
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INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada

Ruediger, Andreas
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INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada
机构:
[1] INRS, Ctr Energie Mat & Telecommun, Nanoelect Nanophoton, 1650 Lionel Boulet, Varennes, PQ J3X 1S2, Canada
来源:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
|
2016年
/
34卷
/
02期
关键词:
ELECTRORESISTANCE;
D O I:
10.1116/1.4934647
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
The authors report on a new table top radio frequency (RF)-magnetron sputtering unit and process for the sputter deposition of barium titanate thin films. Like silicon substrate in conventional electronics, strontium titanate (SrTiO3) is the substrate of choice in the emerging field of oxide electronics and hence Nb doped SrTiO3 n-type semiconducting substrates were considered. The authors observe substrate etching and nonstoichiometry in the film composition at high RF-power and low processing pressure, respectively. However, films deposited at 20 mTorr and 10 W of RF power resulted in stoichiometric BaTiO3. Layer by layer (two-dimensional) growth, prerequisite for epitaxial BaTiO3 on Nb:SrTiO3 (100) substrates, were realized at 600 degrees C. Hysteresis loops (phase angle versus applied voltage) in piezoresponse force microscopy confirm ferroelectricity of the films. Ultrathin epitaxial BaTiO3 on Nb: SrTiO3 (100) is of great interest as a ferroelectric tunnel junction with pronounced contrast between the ON/OFF tunnel resistance. (C) 2015 American Vacuum Society.
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共 17 条
[1]
Giant tunnel electroresistance for non-destructive readout of ferroelectric states
[J].
Garcia, V.
;
Fusil, S.
;
Bouzehouane, K.
;
Enouz-Vedrenne, S.
;
Mathur, N. D.
;
Barthelemy, A.
;
Bibes, M.
.
NATURE,
2009, 460 (7251)
:81-84

Garcia, V.
论文数: 0 引用数: 0
h-index: 0
机构:
Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France
Univ Paris Sud, F-91405 Orsay, France
Univ Cambridge, Dept Mat Sci, Cambridge CB2 3QZ, England Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

Fusil, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France
Univ Paris Sud, F-91405 Orsay, France
Univ dEvry Val dEssonne, F-91025 Evry, France Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

论文数: 引用数:
h-index:
机构:

Enouz-Vedrenne, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Thales Res & Technol, F-91767 Palaiseau, France Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

Mathur, N. D.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Dept Mat Sci, Cambridge CB2 3QZ, England Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

Barthelemy, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France
Univ Paris Sud, F-91405 Orsay, France Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France

Bibes, M.
论文数: 0 引用数: 0
h-index: 0
机构:
Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France
Univ Paris Sud, F-91405 Orsay, France Unite Mixte Phys CNRS Thales, F-91767 Palaiseau, France
[2]
Ferroelectric tunnel junctions for information storage and processing
[J].
Garcia, Vincent
;
Bibes, Manuel
.
NATURE COMMUNICATIONS,
2014, 5

Garcia, Vincent
论文数: 0 引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, France CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France

Bibes, Manuel
论文数: 0 引用数: 0
h-index: 0
机构:
CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
Univ Paris 11, F-91405 Orsay, France CNRS Thales, Unite Mixte Phys, F-91767 Palaiseau, France
[3]
Tunneling Electroresistance Effect in Ferroelectric Tunnel Junctions at the Nanoscale
[J].
Gruverman, A.
;
Wu, D.
;
Lu, H.
;
Wang, Y.
;
Jang, H. W.
;
Folkman, C. M.
;
Zhuravlev, M. Ye.
;
Felker, D.
;
Rzchowski, M.
;
Eom, C. -B.
;
Tsymbal, E. Y.
.
NANO LETTERS,
2009, 9 (10)
:3539-3543

Gruverman, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Nebraska, Lincoln, NE 68588 USA Univ Nebraska, Lincoln, NE 68588 USA

Wu, D.
论文数: 0 引用数: 0
h-index: 0
机构:
N Carolina State Univ, Raleigh, NC 27695 USA Univ Nebraska, Lincoln, NE 68588 USA

Lu, H.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Nebraska, Lincoln, NE 68588 USA Univ Nebraska, Lincoln, NE 68588 USA

Wang, Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Nebraska, Lincoln, NE 68588 USA Univ Nebraska, Lincoln, NE 68588 USA

Jang, H. W.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Wisconsin, Madison, WI 53706 USA Univ Nebraska, Lincoln, NE 68588 USA

Folkman, C. M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Wisconsin, Madison, WI 53706 USA Univ Nebraska, Lincoln, NE 68588 USA

Zhuravlev, M. Ye.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Nebraska, Lincoln, NE 68588 USA
RAS, NS Kurnakov Gen & Inorgan Chem Inst, Moscow 117901, Russia Univ Nebraska, Lincoln, NE 68588 USA

Felker, D.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Wisconsin, Madison, WI 53706 USA Univ Nebraska, Lincoln, NE 68588 USA

Rzchowski, M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Wisconsin, Madison, WI 53706 USA Univ Nebraska, Lincoln, NE 68588 USA

Eom, C. -B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Wisconsin, Madison, WI 53706 USA Univ Nebraska, Lincoln, NE 68588 USA

Tsymbal, E. Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Nebraska, Lincoln, NE 68588 USA Univ Nebraska, Lincoln, NE 68588 USA
[4]
Emerging memories: resistive switching mechanisms and current status
[J].
Jeong, Doo Seok
;
Thomas, Reji
;
Katiyar, R. S.
;
Scott, J. F.
;
Kohlstedt, H.
;
Petraru, A.
;
Hwang, Cheol Seong
.
REPORTS ON PROGRESS IN PHYSICS,
2012, 75 (07)

Jeong, Doo Seok
论文数: 0 引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Thomas, Reji
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00936 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00936 USA Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Katiyar, R. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Puerto Rico, Dept Phys, San Juan, PR 00936 USA
Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00936 USA Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Scott, J. F.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Kohlstedt, H.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak Kiel, D-24143 Kiel, Germany Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Petraru, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak Kiel, D-24143 Kiel, Germany Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea

Hwang, Cheol Seong
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, WCU Hybrid Mat Program, Dept Mat Sci & Engn, Seoul 151744, South Korea
Seoul Natl Univ, Interuniv Semicond Res Ctr, Seoul 151744, South Korea Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea
[5]
Critical thickness of ultrathin ferroelectric BaTiO3 filMS -: art. no. 102907
[J].
Kim, YS
;
Kim, DH
;
Kim, JD
;
Chang, YJ
;
Noh, TW
;
Kong, JH
;
Char, K
;
Park, YD
;
Bu, SD
;
Yoon, JG
;
Chung, JS
.
APPLIED PHYSICS LETTERS,
2005, 86 (10)
:1-3

Kim, YS
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, ReCOE, Seoul 151747, South Korea Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Kim, DH
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Kim, JD
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Chang, YJ
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Noh, TW
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Kong, JH
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Char, K
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Park, YD
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Bu, SD
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Yoon, JG
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea

Chung, JS
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, ReCOE, Seoul 151747, South Korea
[6]
Theoretical current-voltage characteristics of ferroelectric tunnel junctions
[J].
Kohlstedt, H
;
Pertsev, NA
;
Contreras, JR
;
Waser, R
.
PHYSICAL REVIEW B,
2005, 72 (12)

Kohlstedt, H
论文数: 0 引用数: 0
h-index: 0
机构: Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

Pertsev, NA
论文数: 0 引用数: 0
h-index: 0
机构: Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

Contreras, JR
论文数: 0 引用数: 0
h-index: 0
机构: Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany

Waser, R
论文数: 0 引用数: 0
h-index: 0
机构: Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[7]
Polarization Control of Electron Tunneling into Ferroelectric Surfaces
[J].
Maksymovych, Peter
;
Jesse, Stephen
;
Yu, Pu
;
Ramesh, Ramamoorthy
;
Baddorf, Arthur P.
;
Kalinin, Sergei V.
.
SCIENCE,
2009, 324 (5933)
:1421-1425

Maksymovych, Peter
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

Jesse, Stephen
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

Yu, Pu
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

Ramesh, Ramamoorthy
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

Baddorf, Arthur P.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

Kalinin, Sergei V.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA
[8]
FERROELECTRIC MEMORIES
[J].
SCOTT, JF
;
DEARAUJO, CAP
.
SCIENCE,
1989, 246 (4936)
:1400-1405

SCOTT, JF
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV COLORADO,MICROELECTR LAB,COLORADO SPRINGS,CO 80933 UNIV COLORADO,MICROELECTR LAB,COLORADO SPRINGS,CO 80933

DEARAUJO, CAP
论文数: 0 引用数: 0
h-index: 0
机构:
UNIV COLORADO,MICROELECTR LAB,COLORADO SPRINGS,CO 80933 UNIV COLORADO,MICROELECTR LAB,COLORADO SPRINGS,CO 80933
[9]
Layer-by-layer and pseudo-two-dimensional growth modes for heteroepitaxial BaTiO3 films by exploiting kinetic limitations
[J].
Shin, Junsoo
;
Kalinin, S. V.
;
Borisevich, A. Y.
;
Plummer, E. W.
;
Baddorf, A. P.
.
APPLIED PHYSICS LETTERS,
2007, 91 (20)

Shin, Junsoo
论文数: 0 引用数: 0
h-index: 0
机构: Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

Kalinin, S. V.
论文数: 0 引用数: 0
h-index: 0
机构: Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

Borisevich, A. Y.
论文数: 0 引用数: 0
h-index: 0
机构: Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

Plummer, E. W.
论文数: 0 引用数: 0
h-index: 0
机构: Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

Baddorf, A. P.
论文数: 0 引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[10]
Giant electrode effect on tunnelling electroresistance in ferroelectric tunnel junctions
[J].
Soni, Rohit
;
Petraru, Adrian
;
Meuffels, Paul
;
Vavra, Ondrej
;
Ziegler, Martin
;
Kim, Seong Keun
;
Jeong, Doo Seok
;
Pertsev, Nikolay A.
;
Kohlstedt, Hermann
.
NATURE COMMUNICATIONS,
2014, 5

Soni, Rohit
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak, D-24143 Kiel, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Petraru, Adrian
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak, D-24143 Kiel, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Meuffels, Paul
论文数: 0 引用数: 0
h-index: 0
机构:
Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Vavra, Ondrej
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak, D-24143 Kiel, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Ziegler, Martin
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak, D-24143 Kiel, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Kim, Seong Keun
论文数: 0 引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Jeong, Doo Seok
论文数: 0 引用数: 0
h-index: 0
机构:
Korea Inst Sci & Technol, Elect Mat Res Ctr, Seoul 136791, South Korea Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Pertsev, Nikolay A.
论文数: 0 引用数: 0
h-index: 0
机构:
Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia Univ Kiel, Tech Fak, D-24143 Kiel, Germany

Kohlstedt, Hermann
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Kiel, Tech Fak, D-24143 Kiel, Germany Univ Kiel, Tech Fak, D-24143 Kiel, Germany