Object Detection and Classification of Metal Polishing Shaft Surface Defects Based on Convolutional Neural Network Deep Learning

被引:39
作者
Jiang, Qingsheng [1 ]
Tan, Dapeng [1 ]
Li, Yanbiao [1 ]
Ji, Shiming [1 ]
Cai, Chaopeng [1 ]
Zheng, Qiming [1 ]
机构
[1] Zhejiang Univ Technol, Coll Mech Engn, Hangzhou 320023, Peoples R China
来源
APPLIED SCIENCES-BASEL | 2020年 / 10卷 / 01期
关键词
metal shaft; surface defect; CNN (Convolutional Neural Network); deep learning; object detection; SYSTEM; VISION; INSPECTION;
D O I
10.3390/app10010087
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Defective shafts need to be classified because some defective shafts can be reworked to avoid replacement costs. Therefore, the detection and classification of shaft surface defects has important engineering application value. However, in the factory, shaft surface defect inspection and classification are done manually, with low efficiency and reliability. In this paper, a deep learning method based on convolutional neural network feature extraction is used to realize the object detection and classification of metal shaft surface defects. Through image segmentation, the system methods setting of a Fast-R-CNN object detection framework and parameter optimization settings are implemented to realize the classification of 16,384 x 4096 large image little objects. The experiment proves that the method can be applied in practical production and can also be extended to other fields of large image micro-fine defects with a high light surface. In addition, this paper proposes a method to increase the proportion of positive samples by multiple settings of IOU values and discusses the limitations of the system for defect detection.
引用
收藏
页数:30
相关论文
共 46 条
[1]   Multispectral inspection of citrus in real-time using machine vision and digital signal processors [J].
Aleixos, N ;
Blasco, J ;
Navarrón, F ;
Moltó, E .
COMPUTERS AND ELECTRONICS IN AGRICULTURE, 2002, 33 (02) :121-137
[2]  
[Anonymous], 2014, Comput. Sci.
[3]  
[Anonymous], 2019, ELECTRONICS SWITZ, DOI DOI 10.3390/ELECTRONICS8050481
[4]  
[Anonymous], 2017, 2017 INT ART INT
[5]   Deep Learning-Based Crack Damage Detection Using Convolutional Neural Networks [J].
Cha, Young-Jin ;
Choi, Wooram ;
Buyukozturk, Oral .
COMPUTER-AIDED CIVIL AND INFRASTRUCTURE ENGINEERING, 2017, 32 (05) :361-378
[6]   Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class [J].
Cheon, Sejune ;
Lee, Hankang ;
Kim, Chang Ouk ;
Lee, Seok Hyung .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2019, 32 (02) :163-170
[7]   Product Surface Defect Detection Based On Deep Learning [J].
Chun, Lien Po ;
Zhao, Qiangfu .
2018 16TH IEEE INT CONF ON DEPENDABLE, AUTONOM AND SECURE COMP, 16TH IEEE INT CONF ON PERVAS INTELLIGENCE AND COMP, 4TH IEEE INT CONF ON BIG DATA INTELLIGENCE AND COMP, 3RD IEEE CYBER SCI AND TECHNOL CONGRESS (DASC/PICOM/DATACOM/CYBERSCITECH), 2018, :250-255
[8]  
Dai J, 2016, PROCEEDINGS 2016 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT), P1796, DOI 10.1109/ICIT.2016.7475036
[9]   Similarity Metric For Curved Shapes In Euclidean Space [J].
Demisse, Girum G. ;
Aouada, Djamila ;
Ottersten, Bjorn .
2016 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2016, :5042-5050
[10]   Supervised machine learning based surface inspection by synthetizing artificial defects [J].
Haselmann, M. ;
Gruber, D. P. .
2017 16TH IEEE INTERNATIONAL CONFERENCE ON MACHINE LEARNING AND APPLICATIONS (ICMLA), 2017, :390-395