Raman spectra study of tellurium dioxide (TeO2) crystal

被引：0

作者：

Liu, XJ ^{[1
]}

Qiu, HL

Wang, AH

Yin, ST

You, JL

Jiang, GC

机构：

[1] Acad Sinica, Anhui Inst Opt & Fine Mech, Hefei 230031, Peoples R China

[2] Shanghai Univ, Shanghai City Key Lab Ferromet, Shanghai 200072, Peoples R China

来源：

SPECTROSCOPY AND SPECTRAL ANALYSIS | 2003年 / 23卷 / 03期

关键词：

laser micro-Raman spectrum; real time meassurement; solid/melt growth boundary layers; tellurium dioxide (TeO2);

D O I：

暂无

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The room temperature and high temperature Raman spectra of solid/melt growth boundary layers of TeO2 grown from melt were measured by high-temperature laser-micro-Raman spectrum. By analyzing, vibrational modes of the room temperature Raman spectra peaks of TeO2 crystal from band 200-800 cm(-1) were confimed, the expansion and frequency shift of each peak of the high temperature Raman spectra were interpreted and the possible structure group of the melt was proposed. So, certain foundation for studying the growth theory of functional crystal materials was provided.

引用

页码：484 / 486

页数：3

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