Observation of self-amplified spontaneous emission in the near-infrared and visible wavelengths

被引:44
作者
Babzien, M [1 ]
Ben-Zvi, I
Catravas, P
Fang, JM
Marshall, TC
Wang, XJ
Wurtele, JS
Yakimenko, V
Yu, LH
机构
[1] Brookhaven Natl Lab, Natl Synchrotron Light Source, Upton, NY 11973 USA
[2] MIT, Cambridge, MA 02139 USA
[3] Columbia Univ, Dept Appl Phys, New York, NY 10027 USA
[4] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
来源
PHYSICAL REVIEW E | 1998年 / 57卷 / 05期
关键词
D O I
10.1103/PhysRevE.57.6093
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We report evidence of self-amplified spontaneous emission (SASE) at 1064 and 633 nm. To our knowledge, these are the first measurements of SASE at such a short wavelength and employ the smallest period wiggler, 8.8 mm, used to date in a successful SASE experiment. The experiments were performed with the MIT microwiggler at the Accelerator Test Facility at BNL. Single-pass, on-axis microwiggler emissions within a 25 nm bandwidth have been recorded as a function of beam charge and show a clear enhancement over spontaneous emission. For the measurement at 1064 nm, a single micropulse at 34 MeV with a variable charge of 0-1 nC and less than 5 ps full width at half maximum bunch length was passed through the microwiggler and emissions into a limited solid angle and bandwidth, selected by an aperture and interference filter, were focused onto a silicon photodiode. Enhancement of the emissions, from 2 to 6 times the spontaneous emission level, was observed at the highest charges. In addition, we observed SASE gain at a wavelength of 633 nm at a beam energy of 48 MeV, without detailed measurements.
引用
收藏
页码:6093 / 6100
页数:8
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