Effect of 260 °C reflow on the ability of mold compounds to meet moisture sensitivity level one (MSL1)

被引:6
作者
Fauty, J [1 ]
Cada, LG
Stana, M
机构
[1] ON Semicond, Package Technol Dev Lab, Phoenix, AZ 85008 USA
[2] Intel Technol Philippines Inc, Quezon City 4107, Philippines
[3] Univ Philippines, Quezon City 1101, Philippines
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2005年 / 28卷 / 04期
关键词
260 degrees C reflow; epoxy mold compound (EMC); moisture sensitivity level (MSL); popcorning;
D O I
10.1109/TCAPT.2005.848566
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
While it is fairly common to achieve moisture sensitvity level 1 (MSL1) (85 degrees C/85% RH, 168 h) compliance with a standard eutectic lead/tin solder reflow range of 220 degrees C the ability to extrapolate to 260 degrees C is proving very difficult. The objective of this paper is to correlate adhesion/delamination to various mold compound properties in an attempt to determine which properties from a users standpoint are important in the selection of a proper mold compound to withstand the stresses induced by MSL1 moisture loading and subsequent reflow at 260 degrees C. A second objective of this paper is to investigate the effect mold compound properties have on their ability to adhere to copper substrates as a function of MSL1 moisture loading and simulated solder reflow at 260 degrees C. The ultimate goal is to determine whether it is possible to predict those properties that can be used as a screening method to compare and choose the best candidate compounds. Based on analysis of the data it appears that the combination of room temperature adhesion strength and low moisture absorption seem to be good predictor variables for performance of a mold compound when exposed to MSL testing.
引用
收藏
页码:841 / 851
页数:11
相关论文
共 25 条
[1]   A simple model for the Mode I popcorn effect for IC packages with copper leadframe [J].
Alpern, P ;
Lee, KC ;
Dudek, R ;
Tilgner, R .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2002, 25 (02) :301-308
[2]   On the mode II popcorn effect in thin packages [J].
Alpern, P ;
Dudek, R ;
Schmidt, R ;
Wicher, V ;
Tilgner, R .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2002, 25 (01) :56-65
[3]  
CHUN DS, 1997, P 2 PANP MICR S JAN
[4]   HIGH SOLDER-REFLOW CRACK RESISTANT MOLDING COMPOUND [J].
GALLO, AA ;
TUBBS, TR .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1995, 18 (03) :646-649
[5]   POPCORNING - A FAILURE-MECHANISM IN PLASTIC-ENCAPSULATED MICROCIRCUITS [J].
GALLO, AA ;
MUNAMARTY, R .
IEEE TRANSACTIONS ON RELIABILITY, 1995, 44 (03) :362-367
[6]   MODEL AND ANALYSES FOR SOLDER REFLOW CRACKING PHENOMENON IN SMT PLASTIC PACKAGES [J].
GANESAN, GS ;
BERG, HM .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1993, 16 (08) :940-948
[7]  
Hagel J., 1996, MCKINSEY Q, V1, P4
[8]  
HUANG YE, 1999, SURFACE MOUNT TECHNO, P154
[9]  
*IPC JEDEC, 1999, JSTD020A IPCJEDEC
[10]   Interface adhesion between copper lead frame and epoxy moulding compound: Effects of surface finish, oxidation and dimples [J].
Kim, JK ;
Lebbai, M ;
Liu, JH ;
Kim, JH ;
Yuen, MMF .
50TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 2000 PROCEEDINGS, 2000, :601-608