Heavy ion beam-based nano- and micro-structuring of TiO2 single crystals using self-assembled masks

被引:27
作者
Jensen, J. [1 ]
Skupinski, M. [1 ]
Hjort, K. [1 ]
Sanz, R. [2 ]
机构
[1] Uppsala Univ, Angstrom Lab, Dept Engn Sci, SE-75121 Uppsala, Sweden
[2] CSIC, Inst Ciencia Mat Madrid, Madrid 28049, Spain
关键词
TiO2; ion tracks; ion lithography; colloidal mask; nanopatterning;
D O I
10.1016/j.nimb.2008.03.220
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Fast heavy ion beam-based lithography using masks of self-assembled materials has been applied for transferring well-ordered nano- and micropatterns to rutile TiO2 single crystals. As the induced damage has a high etching selectivity the patterns can be developed in hydrofluoric acid with very high-contrast. Here we present resulting patterns when using a mask of self-ordered silica spheres. The obtained pattern are replicas of the mass distribution of the mask. In addition the shape and size of the regular structures depend on the applied ion energy and fluence. Direct modifications of the optical properties of TiO2 in a well-defined pattern are also presented. (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:3113 / 3119
页数:7
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