Application of transmission ellipsometry to the determination of CD spectra of porphyrin J-aggregates solid-state samples

被引：7
作者：
Arteaga, O. [1 ]
El-Hachemi, Z. [2 ]
Canillas, A. [1 ]
机构：
[1] Univ Barcelona, Dept Fis Aplicada & Opt, E-08028 Barcelona, Spain
[2] Univ Barcelona, Dept Quim, E-08028 Barcelona, Spain
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2008年 / 205卷 / 04期
关键词：
D O I：
10.1002/pssa.200777802
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Transmission-mode perpendicular incidence phase modulated ellipsometry was applied to study anisotropic thin films of porphyrin J-aggregates. A customized data acquisition system and measurement method was implemented to measure seven Mueller matrix elements, which allow us to determine the circular birefringence and dichroism as well as the linear birefringence and dichroism of solid-state films. The examples shown illustrate the performance of the method for obtaining the true circular dichroism and consequently for detecting structural differences in chiral aggregates. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
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页码：797 / 801
页数：5
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