A platform for time-resolved scanning Kerr microscopy in the near-field

被引:18
|
作者
Keatley, Paul S. [1 ]
Loughran, Thomas H. J. [1 ]
Hendry, Euan [1 ]
Barnes, William L. [1 ]
Hicken, Robert J. [1 ]
Childress, Jeffrey R. [2 ]
Katine, Jordan A. [2 ]
机构
[1] Univ Exeter, Dept Phys & Astron, Exeter EX4 4QL, Devon, England
[2] HGST, San Jose Res Ctr, San Jose, CA 95135 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 12期
基金
英国工程与自然科学研究理事会;
关键词
THIN-FILM; MAGNETIZATION DYNAMICS; FERROMAGNETIC-RESONANCE; OPTICAL MICROSCOPE; PERMALLOY; DIFFRACTION; ANISOTROPY; REVERSAL; ELEMENT; MOTION;
D O I
10.1063/1.4998016
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Time-resolved scanning Kerr microscopy (TRSKM) is a powerful technique for the investigation of picosecond magnetization dynamics at sub-micron length scales by means of the magneto-optical Kerr effect (MOKE). The spatial resolution of conventional (focused) Kerr microscopy using a microscope objective lens is determined by the optical diffraction limit so that the nanoscale character of the magnetization dynamics is lost. Here we present a platform to overcome this limitation by means of a near-field TRSKM that incorporates an atomic force microscope (AFM) with optical access to a metallic AFM probe with a nanoscale aperture at its tip. We demonstrate the near-field capability of the instrument through the comparison of time-resolved polar Kerr images of magnetization dynamics within a microscale NiFe rectangle acquired using both near-field and focused TRSKM techniques at a wavelength of 800 nm. The flux-closure domain state of the in-plane equilibrium magnetization provided the maximum possible dynamic polar Kerr contrast across the central domain wall and enabled an assessment of the magneto-optical spatial resolution of each technique. Line profiles extracted from the Kerr images demonstrate that the near-field spatial resolution was enhanced with respect to that of the focused Kerr images. Furthermore, the near-field polar Kerr signal (similar to 1 mdeg) was more than half that of the focused Kerr signal, despite the potential loss of probe light due to internal reflections within the AFM tip. We have confirmed the near-field operation by exploring the influence of the tip-sample separation and have determined the spatial resolution to be similar to 550 nm for an aperture with a sub-wavelength diameter of 400 nm. The spatial resolution of the near-field TRSKM was in good agreement with finite element modeling of the aperture. Large amplitude electric field along regions of the modeled aperture that lie perpendicular to the incident polarization indicate that the aperture can support plasmonic excitations. The comparable near-field and focused polar Kerr signals suggest that such plasmonic excitations may lead to an enhanced near-field MOKE. This work demonstrates that near-field TRSKM can be performed without significant diminution of the polar Kerr signal in relatively large, sub-wavelength diameter apertures, while development of a near-field AFM probe utilizing plasmonic antennas specifically designed for measurements deeper into the nanoscale is discussed. Published by AIP Publishing.
引用
收藏
页数:13
相关论文
共 50 条
  • [1] TIME-RESOLVED NEAR-FIELD SCANNING OPTICAL MICROSCOPY
    BOHM, C
    BANGERT, J
    MERTIN, W
    KUBALEK, E
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1994, 27 (10) : 2237 - 2240
  • [2] Time-resolved second harmonic generation near-field scanning optical microscopy
    Schaller, RD
    Johnson, JC
    Saykally, RJ
    CHEMPHYSCHEM, 2003, 4 (11) : 1243 - 1247
  • [3] Fully time-resolved near-field scanning optical microscopy fluorescence imaging
    Kwak, ES
    Vanden Bout, DA
    ANALYTICA CHIMICA ACTA, 2003, 496 (1-2) : 259 - 266
  • [4] Time-resolved scanning near-field microscopy of InGaN laser diode dynamics
    Schwarz, U. T.
    Lauterbach, C.
    Schillgalies, M.
    Rumbolz, C.
    Furitsch, M.
    Lell, A.
    Haerle, V.
    SEMICONDUCTOR LASERS AND LASER DYNAMICS II, 2006, 6184
  • [5] Time-resolved terahertz time-domain near-field microscopy
    Van Hoof, N. J. J.
    Ter Huurne, S. E. T.
    Rivas, J. Gomez
    Halpin, A.
    OPTICS EXPRESS, 2018, 26 (24): : 32118 - 32129
  • [6] Time-resolved and near-field scanning optical microscopy study on porphyrin J-aggregate
    Miura, A
    Matsumura, K
    Su, X
    Tamai, N
    ACTA PHYSICA POLONICA A, 1998, 94 (5-6) : 835 - 846
  • [7] NEAR-FIELD TIME-RESOLVED SPECTROSCOPY
    TRAUTMAN, J
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1995, 209 : 95 - PHYS
  • [8] Time-resolved scanning near-field optical microscopy with supercontinuum light pulses generated in microstructure fiber
    Nagahara, T
    Imura, K
    Okamoto, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (11): : 4528 - 4533
  • [9] Time-resolved fluorescence near-field scanning optical microscopy studies of conjugated polymer thin films
    Imhof, JM
    Kwak, ES
    Bout, DAV
    APPLICATIONS OF SCANNED PROBE MICROSCOPY TO POLYMERS, 2005, 897 : 12 - 24
  • [10] Time-resolved scanning Kerr microscopy of ferromagnetic structures (invited)
    Freeman, MR
    Hiebert, WK
    Stankiewicz, A
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) : 6217 - 6222