Optical Imaging and Absolute Absorption Cross Section Measurement of Individual Nano-objects on Opaque Substrates: Single-Wall Carbon Nanotubes on Silicon

被引：37

作者：

Christofilos, D. ^{[4
]}

Blancon, J. -C. ^{[3
]}

Arvanitidis, J. ^{[2
]}

San Miguel, A. ^{[3
]}

Ayari, A. ^{[3
]}

Del Fatti, N. ^{[1
]}

Vallee, F. ^{[1
]}

机构：

[1] Univ Lyon 1, CNRS, LASIM FemtoNanoOpt, F-69622 Villeurbanne, France

[2] Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece

[3] Univ Lyon 1, CNRS, LPMCN, F-69622 Villeurbanne, France

[4] Aristotle Univ Thessaloniki, Sch Technol, Div Phys, Thessaloniki 54124, Greece

来源：

JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2012年 / 3卷 / 09期

关键词：

RAMAN-SPECTROSCOPY;

D O I：

10.1021/jz300361g

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Optical detection of an individual single nano-object on an opaque substrate and direct determination of its absorption cross section is demonstrated using reflective spatial modulation spectroscopy. This method is applied to optical imaging and investigation of individual single-wall carbon nanotubes in the 1.6 nm diameter range on silicon substrates, which are also individually characterized by atomic force microscopy, scanning electron microscopy, and in situ micro-Raman spectroscopy. Absorption cross sections on the order of 10(-17) cm(2) per carbon atom are measured for the investigated semiconducting carbon nanotubes, with a light polarization absorption anisotropy of about 2.

引用

页码：1176 / 1181

页数：6

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