Thermal measurements and analysis of AlGaInP/GaInP MQW red LEDs with different chip sizes and substrate thicknesses

被引:27
作者
Lee, H. K. [1 ]
Lee, D. H. [1 ]
Song, Y. M. [2 ]
Lee, Y. T. [2 ]
Yu, J. S. [1 ]
机构
[1] Kyung Hee Univ, Dept Elect & Radio Engn, Yongin 446701, South Korea
[2] Gwangju Inst Sci & Technol, Dept Informat & Commun, Kwangju 500712, South Korea
关键词
Light emitting diodes; AlGaInP/GaInP; Thermal analysis; Junction temperature; LIGHT-EMITTING-DIODES; JUNCTION-TEMPERATURE; QUANTUM EFFICIENCY; LASER-DIODES; CONDUCTIVITY; SUPERLATTICES; ILLUMINATION; ENHANCEMENT; WAVELENGTH; DEVICES;
D O I
10.1016/j.sse.2010.10.007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermal properties of AlGaInP/GaInP MQW red LEDs are investigated by thermal measurements and analysis for different chip sizes and substrate thicknesses. To extract the thermal resistance (R-th), junction temperature (T-j) is experimentally determined by both forward voltage and electroluminescence (EL) emission peak shift methods. For theoretical thermal analysis, thermal parameters are calculated in simulation using measured heat source densities. The T-j value increases with increasing the injection current, and it decreases as the chip size becomes larger. The use of a thin substrate improves the heat removal capability. At 450 mA, the T-j of 315 K and 342 K are measured for 500 x 500 mu m(2) LEDs with 110 mu m and 350 mu m thick substrates, respectively. For 500 x 500 mu m(2) LEDs with 110 mu m thick substrate, the R-th values of 13.99 K/W and 14.89 K/W are obtained experimentally by the forward voltage and EL emission peak shift methods, respectively. The theoretically calculated value is 13.44 K/W, indicating a good agreement with the experimental results. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:79 / 84
页数:6
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