Nanostructure of sol-gel derived TiO2 for thin films on glass substrates measured by small angle scattering of synchrotron light

Nanosized TiO2 thin films on glass substrate of thicknesses ranging from 3 to 12.5 mu m were prepared using sol-gel procedure. The TiO2, crystallite size increased in 'average particle radii' values < R > from 2.5 nm to 3.7 nm with increase of film thickness up to 12.5 mu m. A new SAXS (small angle X-ray scattering) beamline at synchrotron ELLETRA was used to determine grain sizes and specific surface area of these films. (C) 1998 Elsevier Science B.V. All rights reserved.