Improving Prediction Robustness of VAB-SVM for Cross-Project Defect Prediction

被引:6
作者
Ryu, Duksan [1 ]
Choi, Okjoo [1 ]
Baik, Jongmoon [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Comp Sci, 291 Daehak Ro,373-1 Guseong Dong, Taejon 305701, South Korea
来源
2014 IEEE 17TH INTERNATIONAL CONFERENCE ON COMPUTATIONAL SCIENCE AND ENGINEERING (CSE) | 2014年
关键词
Cross-Project Defect Prediction; Transfer Learning; Boosting; Outlier Detection;
D O I
10.1109/CSE.2014.198
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Software defect prediction is important for improving software quality. Defect predictors allow software test engineers to focus on defective modules. Cross-Project Defect Prediction (CPDP) uses data from other companies to build defect predictors. However, outliers may lower prediction accuracy. In this study, we propose a transfer learning based model called VAB-SVM for CPDP robust in handling outliers. Notably, this method deals with the class imbalance problem which may decrease the prediction accuracy. Our proposed method computes similarity weights of the training data based on the test data. Such weights are applied to Boosting algorithm considering the class imbalance. VAB-SVM outperformed the previous research more than 10% and showed a sufficient robustness regardless of the ratio of outliers.
引用
收藏
页码:994 / 999
页数:6
相关论文
共 18 条
[1]  
Aggarwal CC, 2001, SIGMOD RECORD, V30, P37
[2]   LIBSVM: A Library for Support Vector Machines [J].
Chang, Chih-Chung ;
Lin, Chih-Jen .
ACM TRANSACTIONS ON INTELLIGENT SYSTEMS AND TECHNOLOGY, 2011, 2 (03)
[3]  
D'Ambros Marco, 2010, Proceedings of the 2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010), P31, DOI 10.1109/MSR.2010.5463279
[4]   Predicting defect-prone software modules using support vector machines [J].
Elish, Karim O. ;
Elish, Mahmoud O. .
JOURNAL OF SYSTEMS AND SOFTWARE, 2008, 81 (05) :649-660
[5]  
Gray D, 2009, COMM COM INF SC, V43, P223
[6]   An investigation on the feasibility of cross-project defect prediction [J].
He, Zhimin ;
Shu, Fengdi ;
Yang, Ye ;
Li, Mingshu ;
Wang, Qing .
AUTOMATED SOFTWARE ENGINEERING, 2012, 19 (02) :167-199
[7]   A survey of outlier detection methodologies [J].
Hodge V.J. ;
Austin J. .
Artificial Intelligence Review, 2004, 22 (2) :85-126
[8]  
Hsu C.W., 2010, PRACTICAL GUIDE SUPP
[9]  
Kim S, 2011, 2011 33RD INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE), P481, DOI 10.1145/1985793.1985859
[10]   Transfer learning for cross-company software defect prediction [J].
Ma, Ying ;
Luo, Guangchun ;
Zeng, Xue ;
Chen, Aiguo .
INFORMATION AND SOFTWARE TECHNOLOGY, 2012, 54 (03) :248-256