Experimental characterization of the coherence properties of hard x-ray sources

被引：14

作者：

Pelliccia, Daniele ^{[1
]}

Nikulin, Andrei Y. ^{[1
]}

Moser, Herbert O. ^{[2
,3
]}

Nugent, Keith A. ^{[4
]}

机构：

[1] Monash Univ, Sch Phys, ARC Ctr Excellence Coherent Xray Sci, Clayton, Vic 3800, Australia

[2] Natl Univ Singapore, SSLS, Singapore 117603, Singapore

[3] Inst Microstruct Technol, KIT, D-76021 Karlsruhe, Germany

[4] Univ Melbourne, Sch Phys, ARC Ctr Excellence Coherent Xray Sci, Melbourne, Vic 3010, Australia

来源：

OPTICS EXPRESS | 2011年 / 19卷 / 09期

基金：

澳大利亚研究理事会;

关键词：

SYNCHROTRON-RADIATION; TRANSVERSE COHERENCE;

D O I：

10.1364/OE.19.008073

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source. (C) 2011 Optical Society of America

引用

页码：8073 / 8078

页数：6

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