X-ray diffraction structure analysis of MCM-48 mesoporous silica

被引：63
|
作者：
Solovyov, LA [1 ]
Belousov, OV
Dinnebier, RE
Shmakov, AN
Kirik, SD
机构：
[1] Inst Chem & Chem Technol, Krasnoyarsk 660049, Russia
[2] Max Planck Inst Solid State Res, D-70569 Stuttgart, Germany
[3] Boreskov Inst Catalysis, Novosibirsk 630090, Russia
来源：
JOURNAL OF PHYSICAL CHEMISTRY B | 2005年 / 109卷 / 08期
关键词：
D O I：
10.1021/jp0482868
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The structure of MCM-48 mesoporous silicate materials has been fully characterized from X-ray diffraction data by applying recently developed methods of mesostructure analysis and full-profile refinement. The pore wall thickness of both as-made and calcined MCM-48 was determined with high precision to be 8.0(1) Angstrom. No regular variations of the wall thickness were detected, but its density was found to be ca. 10% higher in the low-curvature regions. The surfactant density in the pores was assessed around 0.6-0.7 g/cm(3) and was found to have a distinct minimum in the pore center similar to that detected previously in MCM-41. A new extended model function of the density distribution in MCM-48 is proposed on the basis of the structural features that were revealed.
引用
收藏
页码：3233 / 3237
页数：5
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