Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks

被引:7
作者
Chen, Ching-Yuan [1 ]
Chakrabarty, Krishnendu [1 ]
机构
[1] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA
来源
PROCEEDINGS OF THE 2021 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2021) | 2021年
关键词
D O I
10.23919/DATE51398.2021.9473989
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Deep neural networks (DNNs) are becoming ubiquitous, but hardware-level reliability is a concern when DNN models are mapped to emerging neuromorphic technologies such as memristor-based crossbars. As DNN architectures are inherently fault-tolerant and many faults do not affect inferencing accuracy, careful analysis must be carried out to identify faults that are critical for a given application. We present a misclassification-driven training (MDT) algorithm to efficiently identify critical faults (CFs) in the crossbar. Our results for two DNNs on the CIFAR-10 data set show that MDT can rapidly and accurately identify a large number of CFs-up to 20x faster than a baseline method of forward inferencing with randomly injected faults. We use the set of CFs obtained using MDT and the set of benign faults obtained using forward inferencing to train a machine learning (ML) model to efficiently classify all the crossbar faults in terms of their criticality. We show that the ML model can classify millions of faults within minutes with a remarkably high classification accuracy of over 99%. We present a fault-tolerance solution that exploits this high degree of criticality-classification accuracy, leading to a 93% reduction in the redundancy needed for fault tolerance.
引用
收藏
页码:1074 / 1077
页数:4
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