Direct spectroscopic evidence of self-formed C60 inclusions in fullerenelike hydrogenated carbon films

被引：33

作者：

Buijnsters, J. G. ^{[1
]}

Camero, M. ^{[1
]}

Gago, R. ^{[1
,2
,3
]}

Landa-Canovas, A. R. ^{[1
]}

Gomez-Aleixandre, C. ^{[1
]}

Jimenez, I. ^{[1
]}

机构：

[1] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain

[2] Univ Autonoma Madrid, Ctr Microanal Mat, E-28049 Madrid, Spain

[3] Univ Autonoma Madrid, Dept Fis Aplicada, E-28049 Madrid, Spain

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 14期

关键词：

D O I：

10.1063/1.2903502

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The detection of self-formed C(60) inclusions in hydrogenated carbon (C:H) with fullerenelike (FL) structure is reported. This material is synthesized by bias-enhanced electron cyclotron resonance chemical vapor deposition at low substrate temperatures (< 120 degrees C). The FL structure is identified by high-resolution transmission electron microscopy whereas the presence of C(60) inclusions is derived from spectral signatures in the C(1s) x-ray absorption near edge structure. The formation of FL-C:H takes place for negative bias voltages higher than 100 V, in parallel with dehydrogenation and drastic improvement of the tribomechanical film properties. (C) 2008 American Institute of Physics.

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页数：3

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