Preparation, polymorphic study and structural resolution by X-ray diffraction of polycrystalline samples of (E)-N-benzylidene-4-haloanilines

被引：0
|
作者：
Diaz, L. N. [1 ,2 ]
Soto, A. K. [1 ,2 ]
Henao, J. A. [1 ]
Toro, R. A. [1 ]
Urbina, J. M. [2 ]
机构：
[1] UIS Guatiguara, Grp Invest Quim Estruct GIQUE, Km 2 Via Refugio, Piedecuesta 681011, Colombia
[2] Univ Ind Santander, Escuela Quim, Lab Quim Organ & Biomol LQOBio, Carrera 27 Calle 9, Bucaramanga 680002, Colombia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2021年 / 77卷
关键词：
bencylideneanilines; polymorphic study; crystal structure; green chemistry;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
PS-26-5
引用
收藏
页码：C955 / C955
页数：1
相关论文
共 50 条
  • [1] X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples
    Alexeev, A. V.
    Gromilov, S. A.
    JOURNAL OF STRUCTURAL CHEMISTRY, 2010, 51 (04) : 744 - 757
  • [2] X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples
    A. V. Alexeev
    S. A. Gromilov
    Journal of Structural Chemistry, 2010, 51 : 744 - 757
  • [3] Preparation of a single-crystalline sample-holder for X-ray diffraction with polycrystalline samples
    Tabares-Munoz, C
    Mendoza-Alvarez, ME
    REVISTA MEXICANA DE FISICA, 1998, 44 (05) : 484 - 487
  • [4] STRUCTURAL INVESTIGATIONS OF POLYCRYSTALLINE DIASPORE SAMPLES BY X-RAY-POWDER DIFFRACTION
    KLUG, A
    FARKAS, L
    PHYSICS AND CHEMISTRY OF MINERALS, 1981, 7 (03) : 138 - 140
  • [5] Preparation and X-ray diffraction analysis of CdGeAs2 polycrystalline
    Zhang, Yi
    Zhu, Shi-Fu
    Zhao, Bei-Jun
    He, Zhi-Yu
    Chen, Bao-Jun
    Du, Wen-Juan
    Li, Jia-Wei
    Huang, Wei
    Rengong Jingti Xuebao/Journal of Synthetic Crystals, 2010, 39 (SUPPL.): : 39 - 42
  • [6] Structural characterization of polycrystalline thin films by X-ray diffraction techniques
    Akhilesh Pandey
    Sandeep Dalal
    Shankar Dutta
    Ambesh Dixit
    Journal of Materials Science: Materials in Electronics, 2021, 32 : 1341 - 1368
  • [7] Structural characterization of polycrystalline thin films by X-ray diffraction techniques
    Pandey, Akhilesh
    Dalal, Sandeep
    Dutta, Shankar
    Dixit, Ambesh
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2021, 32 (02) : 1341 - 1368
  • [8] High-resolution X-ray diffraction with no sample preparation
    Hansford, G. M.
    Turner, S. M. R.
    Degryse, P.
    Shortland, A. J.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : 293 - 311
  • [9] Quantitative nanotomography of amorphous and polycrystalline samples using coherent X-ray diffraction
    Chushkin, Y.
    Zontone, F.
    Cherkas, O.
    Gibaud, A.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2019, 52 (03) : 571 - 578
  • [10] AN X-RAY IONIZATION EQUIPMENT FOR INVESTIGATING STRUCTURAL DISTORTIONS IN POLYCRYSTALLINE SAMPLES
    VASILEV, DM
    LIKHACHEV, VA
    INDUSTRIAL LABORATORY, 1959, 25 (06): : 777 - 778
12345