Optical characterisation of amorphous Se-Te-Sn thin films

被引：5

作者：

Sethi, Amit ^{[1
]}

Sharma, Surbhi ^{[2
]}

Sarin, Amit ^{[3
]}

Kumar, Rajesh ^{[4
]}

Sharma, Navjeet ^{[5
]}

机构：

[1] IKG Punjab Tech Univ, Dept Appl Sci, Kapurthala, Punjab, India

[2] Kanya Mahavidyalaya, Dept Phys, Jalandhar, Punjab, India

[3] IKG Punjab Tech Univ, Dept Appl Sci, Kapurthala, Punjab, India

[4] DAV Coll, Dept Phys, Amritsar, Punjab, India

[5] DAV Coll, Dept Phys, Jalandhar, Punjab, India

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2018年 / 124卷 / 12期

关键词：

CHALCOGENIDE GLASSES; CONSTANTS; THICKNESS; SILICON; ALLOYS;

D O I：

10.1007/s00339-018-2257-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Optical characterization of Sn doped Se-Te thin films has been carried out. The characterization has been carried out using transmission spectra in range 500-2500nm. Bulk samples were prepared using melt quenching technique and thin films were deposited using thermal evaporation. XRD analysis was used to confirm the amorphous nature of prepared samples. Optical constants such as refractive index and extinction coefficient have been determined using Swanepoel's method. Variation of refractive index with wavelength has been analysed using single effective oscillator model. Optical band gap of the deposited films was calculated using Tauc plots. The observed properties have been explained using the chemical bond approach.

引用

页数：7

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