共 19 条
- [2] [Anonymous], 2007, Physics of Semiconductor Devices
- [7] [代树武 Dai Shuwu], 2014, [中国科学. 技术科学, Scientia Sinica Technologica], V44, P361
- [9] Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 610 (01): : 225 - 229