Optimal INL/DNL testing of A/D converters using a linear model

被引：13
作者：
Cherubal, S [1 ]
Chatterjee, A [1 ]
机构：
[1] Georgia Inst Technol, Atlanta, GA 30332 USA
来源：
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/TEST.2000.894225
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
As Analog to Digital Converters continue to improve in resolution, their linearity testing was become increasingly challenging in terms of test accuracy and test time. In this paper we present a technique for estimation the linearity metrics of an ADC that is optimal in terms of expected r.m.s error in INL/DNL estimates, for a given test time. Experimental results measured on an ADC from industry to validate the effectiveness of the technique are presented.
引用
收藏
页码：358 / 366
页数：9
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