Synthetic optical holography for in-depth imaging of optical vortices in speckle patterns

被引:4
作者
Di Donato, A. [1 ]
Tamagnone, M. [2 ]
Criante, L. [3 ]
Cavanini, L. [4 ]
Mencarelli, D. [1 ]
Ippoliti, G. [1 ]
Pierantoni, L. [1 ]
Orlando, G. [1 ]
Morini, A. [1 ]
Farina, M. [1 ]
机构
[1] Univ Politecn Marche, Dept Informat Engn, I-60131 Ancona, Italy
[2] Harvard Univ, Harvard John A Paulson Sch Engn & Appl Sci, Cambridge, MA 02138 USA
[3] Ist Italiano Tecnol, Ctr Nano Sci & Technol, I-20133 Milan, Italy
[4] Ind Syst & Control Ltd, Culzean House,36 Renfield St, Glasgow G2 1LU, Lanark, Scotland
来源
AIP ADVANCES | 2019年 / 9卷 / 01期
基金
欧盟地平线“2020”;
关键词
TOPOLOGICAL CHARGE;
D O I
10.1063/1.5053564
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, we report a novel approach based on a lensless Synthetic Optical Holography (SOH) that is aimed to recover the complex scattered field from buried surfaces at different wavelengths with sub-nanometric spectral resolution, without affecting the phase retrieval in depth. The proposed technique is applied to characterize and image the field scattered from a rough embedded surface of a microfluidic channel. The real and imaginary part of the random complex field revealed the presence of 2D optical vortices at each location in which a phase singularity is located. A statistical study of optical vortices is presented and the high spectral resolution is exploited to study the behavior of topological charges with the frequency shift. (C) 2019 Author(s).
引用
收藏
页数:7
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