Simple approach for high-contrast optical imaging and characterization of graphene-based sheets

被引：298

作者：

Jung, Inhwa ^{[1
]}

Pelton, Matthew ^{[2
]}

Piner, Richard ^{[1
]}

Dikin, Dmitriy A. ^{[1
]}

Stankovich, Sasha ^{[1
]}

Watcharotone, Supinda ^{[1
]}

Hausner, Martina ^{[3
]}

Ruoff, Rodney S. ^{[1
]}

机构：

[1] Northwestern Univ, Dept Mech Engn, Evanston, IL 60208 USA

[2] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

[3] Ryerson Univ, Dept Chem & Biol, Toronto, ON M5B 2K3, Canada

来源：

NANO LETTERS | 2007年 / 7卷 / 12期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1021/nl0714177

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.

引用

页码：3569 / 3575

页数：7

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