Outage Probability Analysis of RIS-Assisted Wireless Networks With Von Mises Phase Errors

被引:33
作者
Wang, Tianxiong [1 ]
Badiu, Mihai-Alin [1 ]
Chen, Gaojie [2 ,3 ]
Coon, Justin P. [1 ]
机构
[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
[2] Univ Surrey, Inst Commun Syst, 5GIC, Guildford GU2 7XH, Surrey, England
[3] Univ Surrey, Inst Commun Syst, 6GIC, Guildford GU2 7XH, Surrey, England
基金
英国工程与自然科学研究理事会;
关键词
Signal to noise ratio; Probability; Power system reliability; Wireless networks; Taylor series; Probability density function; Gamma distribution; Reconfigurable intelligent surface (RIS); line-of-sight (LoS); Von Mises distribution; outage probability; PERFORMANCE ANALYSIS; INTELLIGENT; SURFACES;
D O I
10.1109/LWC.2021.3113830
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this letter, we investigate the performance of a communication link assisted by a reconfigurable intelligent surface (RIS) over line-of-sight (LOS) channels. The phase configuration of the RIS is imperfect and the phase error for each reflective element is modeled by a Von Mises distribution. First, we derive novel closed-form approximations for the lower tail distribution of the magnitude of the equivalent channel coefficient. Then, we use the obtained expressions to evaluate the outage probability and diversity order of the proposed system. Approximation errors of the proposed method are analyzed in detail. Simulation results validate the theoretical analysis is accurate at a high signal-to-noise ratio (SNR) regime.
引用
收藏
页码:2737 / 2741
页数:5
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