Large degree of polarization of photoluminescence caused by anisotropic strain in nonpolar a-plane MgxZn1-xO layers grown by plasma-assisted molecular beam epitaxy

被引:2
作者
Chen, X. Y. [1 ]
Pan, X. H. [1 ]
Chen, W. [1 ]
Chen, S. S. [1 ]
Huang, J. Y. [1 ]
Ye, Z. Z. [1 ]
机构
[1] Zhejiang Univ, State Key Lab Silicon Mat, Cyrus Tang Ctr Sensor Mat & Applicat, Sch Mat Sci & Engn, Hangzhou 310027, Peoples R China
基金
中国国家自然科学基金;
关键词
OPTICAL-PROPERTIES; ZNO; FILMS;
D O I
10.1364/OL.41.004727
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A large degree of polarization (rho) of photoluminescence (PL) approximate to 1 is obtained in each nonpolar a-plane MgxZn1-xO layer grown by plasma-assisted molecular beam epitaxy (MBE) with x = 0.01, 0.03, and 0.10, respectively. Anisotropic in-plane strains are selectively introduced by using foreign substrates and doping with different Mg contents, which strongly modify the valence band structures, leading to anisotropic optical properties. A polarized Raman measurement shows that anisotropic in-plane strains along the y and z axes increase with the increasing Mg contents. Polarized PL spectra show that. gradually increases to 0.97 with decreasing in-plane strains, resulting from an increasing difference in transition energy (Delta E) between E perpendicular to c and E parallel to c caused by a lift of the degeneracy of valence band structures. The obtained highly polarized emission is close to linear polarized light, which is desirable in the backlighting of liquid crystal displays. (C) 2016 Optical Society of America
引用
收藏
页码:4727 / 4730
页数:4
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