A novel technique for RTP annealing of compound semiconductors

被引:1
|
作者
Fu, M
Sarvepalli, V
Singh, RK
Abernathy, CR
Cao, X
Pearton, SJ
Sekhar, JA
机构
[1] Micropyret Heaters Int Inc, Cincinnati, OH 45212 USA
[2] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA
关键词
D O I
10.1016/S0038-1101(98)00236-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We introduce for the first time a novel rapid thermal processing (RTP) unit called Zapper(TM), which has recently been developed by MHI Inc. and the University of Florida, for high temperature thermal processing of semiconductors. This Zapper(TM) unit is capable of reaching much higher temperatures (>1500 degrees C) than conventional tungsten-halogen lamp RTP equipment and achieving high ramp-up and ramp-down rates. We have conducted implant activation annealing studies of Si+-implanted GaN thin films (with and without an AlN encapsulation layer) using the Zapper(TM) unit at temperatures up to 1500 degrees C. The electrical property measurements of such annealed samples have led to the conclusion that high annealing temperatures and AlN encapsulation are needed for the optimum activation efficiency of Si+ implants in GaN. It has clearly been demonstrated that the Zapper(TM) unit has tremendous potential for RTP annealing of semiconductor materials, especially for wide band-gap (WBG) compound semiconductors that require very high processing temperatures. (C) 1998 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:2335 / 2340
页数:6
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