Markov chains and probabilistic computation - A general framework for multiplexed nanoelectronic systems

被引:15
作者
Qi, Y [1 ]
Gao, JB [1 ]
Fortes, JAB [1 ]
机构
[1] Univ Florida, Dept Elect & Comp Engn, Adv Comp & Informat Syst Lab, Gainesville, FL 32611 USA
基金
美国国家航空航天局; 美国国家科学基金会;
关键词
fault tolerance; Markov chain; NAND multiplexing; probabilistic computation;
D O I
10.1109/TNANO.2004.834192
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In emerging nanotechnologies, reliable computation will have to be carried out with unreliable components being integral parts of computing systems. One promising scheme for designing these systems is von Neumann's multiplexing technique. Using bifurcation theory and its associated geometrical representation, we have studied a HAND-multiplexing system recently proposed. The behavior of the system is characterized by the stationary distribution of a Markov chain, which is uni- or bi-modal, when the error probability of NAND gates' is larger or smaller than the threshold value, respectively. The two modes and the median of the stationary distribution are the keys to the characterization of the system reliability. Examples of potential future nanochips are used to illustrate how the HAND-multiplexing technique can lead to high system reliability in spite of large gate error probability while keeping the cost of redundancy moderate. In nanoelectronic systems, while permanent defects can be taken care of by reconfiguration, probabilistic computation schemes can incorporate another level of redundancy so that high tolerance of transient errors may be achieved. The Markov chain model is shown to be a powerful tool for the analysis of multiplexed. nanoelectronic systems.
引用
收藏
页码:194 / 205
页数:12
相关论文
共 50 条