Measurement of the Intrinsic Thermal Conductivity of a Multiwalled Carbon Nanotube and Its Contact Thermal Resistance with the Substrate

被引:70
作者
Yang, Juekuan [1 ,2 ]
Yang, Yang [1 ]
Waltermire, Scott W. [1 ]
Gutu, Timothy
Zinn, Alfred A.
Xu, Terry T.
Chen, Yunfei [2 ]
Li, Deyu [1 ]
机构
[1] Vanderbilt Univ, Dept Mech Engn, Nashville, TN 37235 USA
[2] Southeast Univ, Sch Mech Engn, Jiangsu Key Lab Design & Mfg Micronano Biomed Ins, Nanjing 210096, Peoples R China
基金
美国国家科学基金会;
关键词
CONDUCTANCE; TRANSPORT;
D O I
10.1002/smll.201100429
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The intrinsic thermal conductivity of an individual carbon nanotube and its contact thermal resistance with the heat source/sink can be extracted simultaneously through multiple measurements with different lengths of the tube between the heat source and the heat sink. Experimental results on a 66-nm-diameter multiwalled carbon nanotube show that above 100 K, contact thermal resistance can contribute up to 50% of the total measured thermal resistance; therefore, the intrinsic thermal conductivity of the nanotube can be significantly higher than the effective thermal conductivity derived from a single measurement without eliminating the contact thermal resistance. At 300 K, the contact thermal resistance between the tube and the substrate for a unit area is 2.2 x 10(-8) m 2 K W-1, which is on the lower end among several published data. Results also indicate that for nanotubes of relatively high thermal conductance, electron-beam-induced gold deposition at the tube-substrate contacts may not reduce the contact thermal resistance to a negligible level. These results provide insights into the long-lasting issue of the contact thermal resistance in nanotube/nanowire thermal conductity measurements and have important implications for further understanding thermal transport through carbon nanotubes and using carbon nanotube arrays as thermal interface materials.
引用
收藏
页码:2334 / 2340
页数:7
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