Femtosecond near-field scanning optical microscopy study of molecular thin films

被引：1
|
作者：
Kawashima, H [1 ]
Furuki, M
Tatsuura, S
Tian, M
Sato, Y
Pu, LS
Tani, T
机构：
[1] Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan
[2] Femtosecond Technol Res Assoc, Tsukuba, Ibaraki 3052635, Japan
[3] Fuji Xerox Co Ltd, Corp Res Ctr, Kanagawa 2590157, Japan
[4] Tokyo Univ Agr & Technol, Dept Appl Phys, Tokyo 1848588, Japan
来源：
JOURNAL OF MICROSCOPY-OXFORD | 2001年 / 202卷
关键词：
femtosecond time-resolved measurement; near-field optics; near-field scanning optical microscopy;
D O I：
10.1046/j.1365-2818.2001.00791.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A near-field scanning optical microscope has been combined with a two-colour time-resolved pump-probe measurement system. It has a noise-equivalent transmittance change of 5.0 x 10(-5) for a probe pulse with an intensity of 30 nW. The system has been used for evaluating molecular thin films that have a domain structure, particularly for observing a gate action of the single domains. The results include key features to understand an origin of the domains and suggest that the film composition is uniform over a distance of several micrometres.
引用
收藏
页码：241 / 243
页数：3
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