The comparison between FVM and FEM for EIT forward problem

被引：16

作者：

Dong, GY ^{[1
]}

Zou, J

Bayford, RH

Ma, XS

Gao, SK

Yan, W

Ge, ML

机构：

[1] Hebei Univ Technol, Province Minist Joint Key Lab Electromagnet Field, Tianjin 300130, Peoples R China

[2] Tsing Hua Univ, Beijing 100084, Peoples R China

[3] Middlesex Hosp, Dept Clin Neurophysiol, London W1T 8AA, England

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2005年 / 41卷 / 05期

基金：

中国博士后科学基金; 高等学校博士学科点专项科研基金;

关键词：

electrical impedance tomography (EIT); finite element method (FEM); finite volume method (FVM); forward problem;

D O I：

10.1109/TMAG.2005.844558

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

2In this paper, the finite volume method (FVM) is introduced in detail for solving the electrical impedance tomography (EIT) forward problem. A new idea for constructing the primary and secondary elements in FVM is presented. Detailed comparisons between FVM and the finite element method (FEM), including the characteristic of the coefficient matrix and the precision of the results, are carried out under the same mesh system. It is shown that accurate estimates of the potential distribution can be obtained with an FVM solution.

引用

页码：1468 / 1471

页数：4

共 4 条

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