Developments in quantitative convergent beam electron diffraction (CBED)

被引：0

作者：

Saunders, M ^{[1
]}

机构：

[1] Uppsala Univ, Angstrom Lab, Div Analyt Mat Phys, SE-75121 Uppsala, Sweden

来源：

MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：205 / 206

页数：2

共 8 条

[1]

HOLMESTAD R, 1993, INST PHYS CONF SER, P141

[2]

HOLMESTAD R, 1997, P MICR MICR 1997, P1051

[3] MY EARLY WORK ON CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].

MOLLENSTEDT, G .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 116 (01) :13-22

[4] High-precision measurement of temperature factors for NiAl by convergent-beam electron diffraction [J].

Nuchter, W ;

Weickenmeier, AL ;

Mayer, J .

ACTA CRYSTALLOGRAPHICA SECTION A, 1998, 54 :147-157

[5] Quantitative zone-axis convergent-beam electron diffraction (CBED) studies of metals. II. Debye-Waller-factor measurements [J].

Saunders, M ;

Fox, AG ;

Midgley, PA .

ACTA CRYSTALLOGRAPHICA SECTION A, 1999, 55 :480-488

[6] Measurement of low-order structure factors for silicon from zone-axis CBED patterns [J].

Saunders, M ;

Bird, DM ;

Zaluzec, NJ ;

Burgess, WG ;

Preston, AR ;

Humphreys, CJ .

ULTRAMICROSCOPY, 1995, 60 (02) :311-323

[7]

Spence J.C.H., 1992, Electron Microdiffraction, DOI [10.1007/978-1-4899-2353-0, DOI 10.1007/978-1-4899-2353-0]

[8] Refinement of crystal structural parameters using two-dimensional energy-filtered CBED patterns [J].

Tsuda, K ;

Tanaka, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1999, 55 :939-954

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