Characterization of excimer lasers for application to lenslet array homogenizers

被引:6
作者
Lin, Y
Lawrence, GN
Buck, J
机构
[1] Appl Opt Res, Woodland, WA 98674 USA
[2] Cymer Inc, San Diego, CA 92127 USA
关键词
D O I
10.1364/AO.40.001931
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We investigate the best method of characterizing high-divergence lasers, such as excimer lasers, to suppress fine-scale intensity nonuniformity that is due to coherence effects of lenslet homogenizers. We show by a detailed analysis of the lenslet homogenizer that, for highest accuracy, a direct measurement of the value of the autocorrelation function should be made at the separation p of the lenslet elements, identified as the critical spatial period. We show that the commonly used characterization of lasers by the 1/e(2) width of the angular divergence is not the most accurate test and may overstate or understate the effectiveness of a given laser. (C) 2001 Optical Society of America.
引用
收藏
页码:1931 / 1941
页数:11
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