Luminescence properties of Er3+ doped zirconia thin films and ZrO2/Er2O3 nanolaminates grown by atomic layer deposition

被引:4
作者
Aleksanyan, Eduard [1 ]
Kirm, Marco [2 ]
Feldbach, Eduard [2 ]
Kukli, Kaupo [2 ,3 ]
Lange, Sven [2 ]
Sildos, Ilmo [2 ]
Tamm, Aile [2 ]
机构
[1] AI Alikhanyan Natl Sci Lab, 2 Br Alikhanyan Str, Yerevan 0036, Armenia
[2] Univ Tartu, Inst Phys, W Ostwald Str 1, EE-50411 Tartu, Estonia
[3] Univ Helsinki, Dept Chem, POB 55, FI-00014 Helsinki, Finland
关键词
Zirconia; Luminescence; Thin films; Self-trapped excitons; Defects; Er3+ ion; DEFECT-RELATED LUMINESCENCE; PULSED-LASER DEPOSITION; ELECTRONIC-STRUCTURE; OPTICAL-PROPERTIES; X-RAY; OXIDE; ZRO2; PHOTOLUMINESCENCE; EXCITATION; CRYSTALS;
D O I
10.1016/j.optmat.2017.05.003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Atomic layer deposited (ALD) ZrO2 (zirconia) thin films doped with Er3+ ions by ion implantation as well as Zr O-2/Er2O3 nanolaminates were investigated at wide 5-300 K temperature range using cathodoluminescence (CL) and photoluminescence (PL) spectroscopy under wide range of excitation energies 6-120 eV. In the studied ALD films main emissions due to self-trapped excitons and defect centers were revealed in UV-visible (VIS) region with the excitation bands in the host absorption. In nanolaminates luminescence processes are influenced by their structure and composition. In films with the lower Er3+ ion content, typical 4f luminescence of Er3+ ions were identified being excited through energy transfer from host to doping ions. The luminescence data shows that in contrast to a few hundred nm thick ALD films, the excitonic band near 5.3-5.4 eV are absent in the excitation spectra of nanolaminates with a typical layer thickness of 5 nm, which do not facilitate exciton formation because of limited spatial regularity. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:27 / 33
页数:7
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