Surface morphology, structure and transport property of NaxCoO2 thin films grown by pulsed laser deposition

被引:4
作者
Zhang, XP [1 ]
Xiao, YS [1 ]
Zhou, H [1 ]
Xie, BT [1 ]
Yang, C [1 ]
Zhao, YG [1 ]
机构
[1] Tsinghua Univ, Dept Phys, Beijing 100084, Peoples R China
来源
PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, PTS 1-5 | 2005年 / 475-479卷
关键词
NaxCoO2; thin film; PLD; resistivity;
D O I
10.4028/www.scientific.net/MSF.475-479.3807
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, we report the growth of NaxCoO2 thin films by pulsed-laser deposition (PLD). It is shown that the concentration of sodium is very sensitive to the substrate temperature and the target-substrate distance due to the evaporation of sodium during the deposition. alpha'-phase Na0.75CoO2 and gamma-phase Na0.71CoO2 thin films can be obtained with different conditions. Correspondingly, the surface morphology of the films changes from flake-like to particle-like. The temperature dependence of resistivity for the films prepared with the optimal condition shows metallic behavior, consistent with the data of NaxCoO2 single crystals. This work demonstrates that PLD is a promising technique to get high quality NaxCoO2 thin films.
引用
收藏
页码:3807 / 3810
页数:4
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