Single-layered porous silica films on polyethylene terephthalate substrates for antireflection coatings

被引：25
|
作者：
Kum, Byung Gon [1 ]
Park, Yoon Cheol [1 ]
Chang, Yong June [1 ]
Jeon, Jea Yong [3 ]
Jang, Hyun M. [1 ,2 ]
机构：
[1] Pohang Univ Sci & Technol POSTECH, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Pohang Univ Sci & Technol POSTECH, Dept Phys, Pohang 790784, South Korea
[3] DONG A CHEM TECH Res Inst, Deagu 711855, South Korea
来源：
THIN SOLID FILMS | 2011年 / 519卷 / 11期
关键词：
Antireflection; Porous silica; Thin films; Thin film; Cetyltrimethylammonium bromide; Polyethylene terephthalate; Wetting; Optical properties; SURFACES; GLASS;
D O I：
10.1016/j.tsf.2010.12.163
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Single-layered porous silica films were prepared on polyethylene terephthalate (PET) substrates as antireflection coatings for efficient, large-scale flexible optoelectronic devices. Cetyltrimethylammonium bromide (CTAB)-templated synthesis was employed to form porous silica films. Without using high temperature treatment. CTAB was removed by washing in water to create a porous structure in the films. To spin-coat on PET substrates, contact angle between silica sol and PET surface was measured to optimize the molar ratio of the solution. Pore size and surface sharpness were estimated using atomic force microscope data. The average reflectance of as-prepared AR coatings on PET substrates was <= 2%. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：3778 / 3781
页数：4
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