Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

被引:44
作者
Huang, Jianlin [1 ]
Golubovic, Dusan S. [2 ]
Koh, Sau [3 ,8 ]
Yang, Daoguo [4 ]
Li, Xiupeng [5 ]
Fan, Xuejun [6 ,9 ]
Zhang, G. Q. [7 ,10 ]
机构
[1] Delft Univ Technol, Beijing Res Ctr, Beijing 100083, Peoples R China
[2] Lumileds Commercial Shanghai Co Ltd, Shanghai 200233, Peoples R China
[3] Delft Univ Technol, Beijing Res Ctr, Beijing 100083, Peoples R China
[4] Guilin Univ Elect Technol, Guangxi 541004, Peoples R China
[5] Philips Lighting, Shanghai 200233, Peoples R China
[6] State Key Lab Solid State Lighting, Beijing 100083, Peoples R China
[7] Delft Univ Technol, NL-2628 CT Delft, Netherlands
[8] Huawei Technol Co Ltd, Shenzhen, Peoples R China
[9] Lamar Univ, Beaumont, TX 77710 USA
[10] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
基金
美国国家科学基金会;
关键词
Accelerated test; Brownian motion; Degradation test; Light-emitting diodes; Step stress; Wiener process; GEOMETRIC BROWNIAN-MOTION; OPTIMAL-DESIGN; MECHANISMS;
D O I
10.1016/j.ress.2016.06.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, lumen degradation is described by using a modified Brownian motion process for mid power white-light LED packages, which were aged under step stress accelerated degradation test (SSADT). First, a SSADT model has been established based on the theory of equivalent accumulative damage. Then, a method was proposed to improve the accuracy of the parameter estimation by carefully modifying the estimator, which was proposed in the previous research. Experimental data show that parameters estimated by using SSADT model are very close to those estimated by using constant stress accelerated degradation test (CSADT) model, indicating the feasibility of the SSADT model. The experiment also indicates that SSADT can be used as an alternative to CSADT, as it enables comparable estimation accuracy, while using less testing time, a smaller sample size and less test capacity. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:152 / 159
页数:8
相关论文
共 51 条
  • [11] Optimum step-stress accelerated degradation test for Wiener degradation process under constraints
    Hu, Cheng-Hung
    Lee, Ming-Yung
    Tang, Jen
    [J]. EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, 2015, 241 (02) : 412 - 421
  • [12] Rapid Degradation of Mid-Power White-Light LEDs in Saturated Moisture Conditions
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (04) : 478 - 485
  • [13] Degradation modeling of mid-power white-light LEDs by using Wiener process
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    [J]. OPTICS EXPRESS, 2015, 23 (15): : A966 - A978
  • [14] Degradation Mechanisms of Mid-Power White-Light LEDs Under High-Temperature-Humidity Conditions
    Huang, Jianlin
    Golubovic, Dusan S.
    Koh, Sau
    Yang, Daoguo
    Li, Xiupeng
    Fan, Xuejun
    Zhang, G. Q.
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (02) : 220 - 228
  • [15] Remaining Useful Life Prediction for a Nonlinear Heterogeneous Wiener Process Model With an Adaptive Drift
    Huang, Zeyi
    Xu, Zhengguo
    Wang, Wenhai
    Sun, Youxian
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2015, 64 (02) : 687 - 700
  • [16] I. E. S. O. N. America, 2011, PROJ LONG TERM LUM M
  • [17] I. T. P. Committee, 2008, APPR METH MEAS LUM M
  • [18] Koh S, 2013, 2013 14TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME)
  • [19] SOME LIMIT RESULTS FOR PROBABILITIES ESTIMATES OF BROWNIAN MOTION WITH POLYNOMIAL DRIFT
    Li, Jiao
    [J]. INDIAN JOURNAL OF PURE & APPLIED MATHEMATICS, 2010, 41 (03) : 425 - 442
  • [20] Optimal design for step-stress accelerated degradation tests
    Liao, CM
    Tseng, ST
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2006, 55 (01) : 59 - 66