Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

被引:44
作者
Huang, Jianlin [1 ]
Golubovic, Dusan S. [2 ]
Koh, Sau [3 ,8 ]
Yang, Daoguo [4 ]
Li, Xiupeng [5 ]
Fan, Xuejun [6 ,9 ]
Zhang, G. Q. [7 ,10 ]
机构
[1] Delft Univ Technol, Beijing Res Ctr, Beijing 100083, Peoples R China
[2] Lumileds Commercial Shanghai Co Ltd, Shanghai 200233, Peoples R China
[3] Delft Univ Technol, Beijing Res Ctr, Beijing 100083, Peoples R China
[4] Guilin Univ Elect Technol, Guangxi 541004, Peoples R China
[5] Philips Lighting, Shanghai 200233, Peoples R China
[6] State Key Lab Solid State Lighting, Beijing 100083, Peoples R China
[7] Delft Univ Technol, NL-2628 CT Delft, Netherlands
[8] Huawei Technol Co Ltd, Shenzhen, Peoples R China
[9] Lamar Univ, Beaumont, TX 77710 USA
[10] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
基金
美国国家科学基金会;
关键词
Accelerated test; Brownian motion; Degradation test; Light-emitting diodes; Step stress; Wiener process; GEOMETRIC BROWNIAN-MOTION; OPTIMAL-DESIGN; MECHANISMS;
D O I
10.1016/j.ress.2016.06.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, lumen degradation is described by using a modified Brownian motion process for mid power white-light LED packages, which were aged under step stress accelerated degradation test (SSADT). First, a SSADT model has been established based on the theory of equivalent accumulative damage. Then, a method was proposed to improve the accuracy of the parameter estimation by carefully modifying the estimator, which was proposed in the previous research. Experimental data show that parameters estimated by using SSADT model are very close to those estimated by using constant stress accelerated degradation test (CSADT) model, indicating the feasibility of the SSADT model. The experiment also indicates that SSADT can be used as an alternative to CSADT, as it enables comparable estimation accuracy, while using less testing time, a smaller sample size and less test capacity. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:152 / 159
页数:8
相关论文
共 51 条
  • [1] [Anonymous], 2006, Chinese Journal of Semiconductors, V27, P560
  • [2] Long-term degradation mechanisms of mid-power LEDs for lighting applications
    Buffolo, M.
    De Santi, C.
    Meneghini, M.
    Rigon, D.
    Meneghesso, G.
    Zanoni, E.
    [J]. MICROELECTRONICS RELIABILITY, 2015, 55 (9-10) : 1754 - 1758
  • [3] Cai M., 2012, EUROSIME 2012, p1/6
  • [4] Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method
    Cai, Miao
    Yang, Daoguo
    Tian, Kunmiao
    Zhang, Ping
    Chen, Xianping
    Liu, Lilin
    Zhang, Guoqi
    [J]. MICROELECTRONICS RELIABILITY, 2015, 55 (9-10) : 1784 - 1789
  • [5] Degradation Tests Using Geometric Brownian Motion Process for Lumen Degradation Data
    Chiang, Jyun-You
    Lio, Y. L.
    Tsai, Tzong-Ru
    [J]. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 2015, 31 (08) : 1797 - 1806
  • [6] MODELS FOR VARIABLE-STRESS ACCELERATED LIFE TESTING EXPERIMENTS BASED ON WIENER-PROCESSES AND THE INVERSE GAUSSIAN DISTRIBUTION
    DOKSUM, KA
    HOYLAND, A
    [J]. TECHNOMETRICS, 1992, 34 (01) : 74 - 82
  • [7] Lifetime Estimation of High-Power White LED Using Degradation-Data-Driven Method
    Fan, Jiajie
    Yung, Kam-Chuen
    Pecht, Michael
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2012, 12 (02) : 470 - 477
  • [8] Freitas Marta Afonso, 2010, Pesqui. Oper., V30, P194, DOI 10.1590/S0101-74382010000100010
  • [9] Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test
    Haghighi, Firoozeh
    Bae, Suk Joo
    [J]. IEEE TRANSACTIONS ON RELIABILITY, 2015, 64 (03) : 960 - 971
  • [10] Optimality of equidistant sampling designs for the Brownian motion with a quadratic drift
    Harman, Radoslav
    Stulajter, Frantisek
    [J]. JOURNAL OF STATISTICAL PLANNING AND INFERENCE, 2011, 141 (08) : 2750 - 2758