共 10 条
- [1] ELECTRON POPULATION ANALYSIS OF ACCURATE DIFFRACTION DATA .7. NET ATOMIC CHARGES AND MOLECULAR DIPOLE-MOMENTS FROM SPHERICAL-ATOM X-RAY REFINEMENTS, AND THE RELATION BETWEEN ATOMIC CHARGE AND SHAPE [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (JAN): : 63 - 72
- [2] HAGA Y, 1995, THESIS TOHOKU U
- [3] IBERS JA, 1974, INT TABLES XRAY CRUS, V4
- [4] PRESSURE-INDUCED VALENCE CHANGE IN CERIUM PHOSPHIDE [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (07) : 366 - 369
- [7] ACCURATE STRUCTURE-ANALYSIS BY THE MAXIMUM-ENTROPY METHOD [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1990, 46 : 263 - 270
- [9] ELECTRONIC AND CRYSTALLOGRAPHIC TRANSITIONS INDUCED BY PRESSURE IN CEP [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1987, 20 (23): : 3439 - 3444
- [10] MEM analysis of electron-density distributions for silicon and diamond using short-wavelength X-rays (W K alpha(1)) [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 : 606 - 613