Diffusion-induced recrystallization in silver-palladium layers

被引：19

作者：

Baither, D. ^{[1
]}

Kim, T. H. ^{[1
]}

Schmitz, G. ^{[1
]}

机构：

[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany

来源：

SCRIPTA MATERIALIA | 2008年 / 58卷 / 02期

关键词：

sputtering; multilayer thin films; diffusion-induced recrystallization; analytical electron microscopy; X-ray diffraction (XRD);

D O I：

10.1016/j.scriptamat.2007.09.030

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The interdiffusion of Pd-Ag thin film diffusion couples is investigated by transmission electron microscopy and X-ray diffractometry at a temperature of 723 K. By comparison with calculated diffractograms, it is shown that a diffusion-induced recrystallization takes place, which produces a first generation of new grains with a dominant composition of 24.5 at.% Pd inside the diffusion zone. (c) 2007 Acta Materialia, Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：99 / 102

页数：4

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